Removal of a Lead Film from Graphene by Xenon-Beam Bombardment: Computer Experiment

Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 2015, Vol. 9, No. 5, pp. 1099–1106. © Pleiades Publishing, Ltd., 2015.

A. E. Galashev and V. A. Polukhin

Abstract—The process of the bombardment of a Pb film on modified graphene at an incident angle of 75° inthe range of Xe₁₃ cluster energies of 5 to 30 eV is studied using the molecular dynamics method. The modification includes the creation of divacancies located approximately uniformly over the graphene sheet, as well as hydrogenation of the graphene edges and the partial hydrogenation of divacancy boundaries. The horizontal and vertical components of the self-diffusion coefficient of the lead film and graphene, stresses on the horizontal metal and graphene surfaces, the angular distribution of the nearest geometric neighbors in graphene, and the roughness of the graphene-sheet surface during Xe₁₃ cluster bombardment of a target are calculated. The graphene was completely purified of lead only under 30-eV Xe₁₃ cluster impacts. The separation of lead from graphene was predominantly collective. None of the bombardments leads to serious damage to the graphene.

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