Simulation of the Removal of a Lead Film from Graphene by the Irradiation of a Target with a Beam of Xenon Clusters

Russian Journal of Physical Chemistry B, 2016, Vol. 10, No. 1, pp. 15–22. © Pleiades Publishing, Ltd., 2016.

Original Russian Text © A.E. Galashev, V.A. Polukhin, 2016, published in Khimicheskaya Fizika, 2016, Vol. 35, No. 2, pp. 18–25.

A. E. Galashev and V. A. Polukhin

Abstract—The removal of a lead film from graphene by irradiating a target with a beam of xenon clusters at an incidence angle of 60° was studied by the molecular dynamics method. The complete purification of graphene was achieved at beam energies of 10 and 15 eV. Visual observation and the calculated density profiles and mobility components of the lead atoms indicate the predominantly collective nature of the separation of Pb from graphene in the course of bombardment. When a beam of clusters with energy of 15 eV acts on the target, the detached film of lead takes a torch shape and has strong internal stresses. The graphene sheet acquires maximum roughness at a beam energy of 10 eV as a result of a large number of the direct hits of xenon clusters on its surface.

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